[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - The influence of process variations on the robustness of an audio power IC
Krabbenborg, B., Van Der Pol, J.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888223
File:
PDF, 250 KB
english, 1996