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[IEEE 2010 IEEE 10th Conference on Nanotechnology (IEEE-NANO) - Ilsan, Gyeonggi-Do, Korea (South) (2010.08.17-2010.08.20)] 10th IEEE International Conference on Nanotechnology - Modeling fluctuations in the threshold voltage and ON-current and threshold voltage fluctuation due to random telegraph noise

Ashraf, Nabil, Vasileska, Dragica, Klimeck, Gerhard
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Year:
2010
DOI:
10.1109/nano.2010.5697821
File:
PDF, 273 KB
2010
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