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An SEU analysis approach for error propagation in digital VLSI CMOS ASICs
Baze, M.P., Buchner, S., Bartholet, W.G., Dao, T.A.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489228
Date:
January, 1995
File:
PDF, 586 KB
english, 1995