An SEU analysis approach for error propagation in digital...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

An SEU analysis approach for error propagation in digital VLSI CMOS ASICs

Baze, M.P., Buchner, S., Bartholet, W.G., Dao, T.A.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489228
Date:
January, 1995
File:
PDF, 586 KB
english, 1995
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