[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - Probabilistic Gate Level Fault Modeling for Near and Sub-Threshold CMOS Circuits
Amaricai, Alexandru, Nimara, Sergiu, Boncalo, Oana, Chen, Jiaoyan, Popovici, EmanuelYear:
2014
Language:
english
DOI:
10.1109/dsd.2014.92
File:
PDF, 443 KB
english, 2014