[IEEE 30th European Microwave Conference, 2000 - Paris, France (2000.10.4-2000.10.6)] 30th European Microwave Conference, 2000 - Temperature Noise Model for MOSFET Noise Characterization
Pascht, A., Wiegner, D., Berroth, M.Year:
2000
Language:
english
DOI:
10.1109/euma.2000.338606
File:
PDF, 2.94 MB
english, 2000