![](/img/cover-not-exists.png)
[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Evolution of thermal sensors in Intel processors from 90nm to 22nm
Shor, Joseph, Luria, KostaYear:
2012
Language:
english
DOI:
10.1109/eeei.2012.6377117
File:
PDF, 2.31 MB
english, 2012