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[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Evolution of thermal sensors in Intel processors from 90nm to 22nm

Shor, Joseph, Luria, Kosta
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Year:
2012
Language:
english
DOI:
10.1109/eeei.2012.6377117
File:
PDF, 2.31 MB
english, 2012
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