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[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - A tight-binding study of channel modulation in atomic-scale Si:P nanowires
Ryu, Hoon, Lee, Sunhee, Weber, Bent, Mahapatra, Suddhasatta, Simmons, Michelle Y., Hollenberg, Lloyd C. L., Klimeck, GerhardYear:
2013
Language:
english
DOI:
10.1109/sispad.2013.6650578
File:
PDF, 2.34 MB
english, 2013