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[IEEE 2001 IEEE International SOI Conference. Proceedings - Durango, CO, USA (1-4 Oct. 2001)] 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) - The role of externally applied body-bias on the hot-carrier degradation of partially depleted SOI N-MOSFETs
Dieudonne, F., Jomaah, J., Ioannou, D., Raynaud, C., Balestra, F.Year:
2001
Language:
english
DOI:
10.1109/soic.2001.958017
File:
PDF, 184 KB
english, 2001