[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Statistical prediction of NBTI-induced circuit aging
Wang, Wenping, Balakrishnan, Varsha, Bo Yang,, Yu Cao,Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734563
File:
PDF, 2.25 MB
english, 2008