[IEEE 2013 IEEE International Conference on Control Applications (CCA) - Hyderabad, India (2013.08.28-2013.08.30)] 2013 IEEE International Conference on Control Applications (CCA) - Process history-based Fault Detection and Diagnosis for VAVAC systems
Beghi, Alessandro, CecChinato, Luca, Corso, Lorenzo, Rampazzo, Mirco, Simmini, FrancescoYear:
2013
Language:
english
DOI:
10.1109/cca.2013.6662909
File:
PDF, 666 KB
english, 2013