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[IEEE 2012 8th IEEE International Symposium on Instrumentation and Control Technology (ISICT) - London, United Kingdom (2012.07.11-2012.07.13)] 2012 8th IEEE International Symposium on Instrumentation and Control Technology (ISICT) Proceedings - The design and simulation study of the electrothermal excitation resonant beam based on slit-structure stress concentration effect
Shi, HuiChao, Fan, Shangchun, Xing, Weiwei, Sun, JinhaoYear:
2012
Language:
english
DOI:
10.1109/isict.2012.6291604
File:
PDF, 315 KB
english, 2012