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[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Analysis and path localization of gate current in AlGaN/GaN HEMTs using low frequency noise measurements and Optical Beam Induced Resistance Change technique
Karboyan, S., Tartarin, J. G., Carisetti, D., Lambert, B.Year:
2013
Language:
english
DOI:
10.1109/mwsym.2013.6697490
File:
PDF, 551 KB
english, 2013