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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Test structure and verification on the MOSFET under bond pad for area-efficient I/O layout in high-pin-count SOC IC's
Ming-Dou Ker,, Jeng-Jie Peng,, Hsin-Chin Jiang,Year:
2003
Language:
english
DOI:
10.1109/icmts.2003.1197455
File:
PDF, 474 KB
english, 2003