Automatic bubble defect inspection for microwave...

International Journal of Production Research 2010 / 04 Vol. 48; Iss. 8

Automatic bubble defect inspection for microwave communication substrates using multi-threshold technique based co-occurrence matrix

Jiang, Bernard C., Wang, Chien-Chih, Chen, Hsin-Ju, Chu, Chien-Cheng
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Volume:
48
Language:
english
Journal:
International Journal of Production Research
DOI:
10.1080/00207540802680534
Date:
April, 2010
File:
PDF, 956 KB
english, 2010
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