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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - A 1.7mm-Square 3.2kV Low Leakage Current Si MOSFET
Komachi, Tomonori, Takayama, Tadahiko, Imamura, MakotoYear:
2006
Language:
english
DOI:
10.1109/iedm.2006.346932
File:
PDF, 569 KB
english, 2006