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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - FREP: A soft error resilient pipelined RISC architecture
Kumar, Viney, Choudhary, Rahul Raj, Singh, VirendraYear:
2010
Language:
english
DOI:
10.1109/ewdts.2010.5742103
File:
PDF, 378 KB
english, 2010