[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan...

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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Test Data Compression Based on Clustered Random Access Scan

Hu, Yu, Li, Cheng, Li, Jia, Han, Yin-he, Li, Xiao-wei, Wang, Wei, Li, Hua-wei, Wang, Laung-terng(l.t), Wen, Xiao-qing
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Year:
2006
Language:
english
DOI:
10.1109/ats.2006.261025
File:
PDF, 250 KB
english, 2006
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