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[IEEE Comput. Soc 19th IEEE VLSI Test Symposium. VTS 2001 - Marina Del Rey, CA, USA (29 April-3 May 2001)] Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 - An evaluation of pseudo random testing for detecting real defects
Chao-Wen Tseng,, Mitra, S., Davidson, S., McCluskey, E.J.Year:
2001
Language:
english
DOI:
10.1109/vts.2001.923469
File:
PDF, 558 KB
english, 2001