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Digital model for X-ray diffraction with application to composition and strain determination in strained InAs/GaSb superlattices
Meng, Yifei, Kim, Honggyu, Rouviére, Jean-Luc, Isheim, Dieter, Seidman, David N., Zuo, Jian-MinVolume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4887078
Date:
July, 2014
File:
PDF, 2.90 MB
english, 2014