Experimental Study on Breakdown of Mobility Universality in $\langle 100\rangle$-Directed (110)-Oriented pMOSFETs
Shimizu, Ken, Tsutsui, Gen, Januar, Doni, Saraya, Takuya, Hiramoto, ToshiroVolume:
6
Language:
english
Journal:
IEEE Transactions On Nanotechnology
DOI:
10.1109/tnano.2007.894556
Date:
May, 2007
File:
PDF, 737 KB
english, 2007