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[IEEE 2010 3rd Electronic System-Integration Technology Conference (ESTC) - Berlin, Germany (2010.09.13-2010.09.16)] 3rd Electronics System Integration Technology Conference ESTC - Development of charged particle detectors by integrating gas amplification stages and CMOS ASICS on wafer level
Kaminski, Jochen, Baumgartner, Tobias, Desch, Klaus, Ehrmann, Oswin, Fritzsch, Thomas, Krautscheid, Thorsten, Mayer, Stefan, Topper, MichaelYear:
2010
Language:
english
DOI:
10.1109/estc.2010.5642941
File:
PDF, 1.32 MB
english, 2010