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[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Effects of Aperture Thickness on the Shielding Effectiveness of Metallic Enclosures
Araneo, Rodolfo, Lovat, Giampiero, Paulotto, SimoneYear:
2007
Language:
english
DOI:
10.1109/isemc.2007.221
File:
PDF, 418 KB
english, 2007