[IEEE 2011 IEEE International Electron Devices Meeting...

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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Extended scalability and functionalities of MRAM based on thermally assisted writing

Dieny, B., Sousa, R., Bandiera, S., Castro Souza, M., Auffret, S., Rodmacq, B., Nozieres, J.P., Herault, J., Gapihan, E., Prejbeanu, I.L., Ducruet, C., Portemont, C., Mackay, K., Cambou, B.
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Year:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131471
File:
PDF, 1.01 MB
english, 2011
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