[IEEE 1997 IEEE MTT-S International Microwave Symposium Digest - Denver, CO, USA (8-13 June 1997)] 1997 IEEE MTT-S International Microwave Symposium Digest - A calibration procedure for W-band on-wafer testing
Yon-Lin Kok,, DuFault, M., Tian-Wei Huang,, Huei Wang,Volume:
3
Year:
1997
Language:
english
DOI:
10.1109/mwsym.1997.596723
File:
PDF, 296 KB
english, 1997