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[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Extraction of parameters and simulation of the hard breakdown I-V characteristics in ultrathin gate oxides
Miranda, E., Ortiz-Conde, A., Sanchez, F.J.G., Farkas, E.Year:
2005
Language:
english
DOI:
10.1109/ipfa.2005.1469150
File:
PDF, 315 KB
english, 2005