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[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - ACT: a DFT tool for self-timed circuits

Khoche, A., Brunvand, E.
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Year:
1997
Language:
english
DOI:
10.1109/test.1997.639697
File:
PDF, 677 KB
english, 1997
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