Lumped Models for Assessment and Optimization of Bipolar...

IEEE Transactions on Electron Devices 2013 / 11 Vol. 60; Iss. 11

Lumped Models for Assessment and Optimization of Bipolar Device RF Noise Performance

Vitale, Francesco, van der Toorn, Ramses
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2281237
Date:
November, 2013
File:
PDF, 809 KB
english, 2013
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