Analysis of single event effects at grazing angle [CMOS...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Analysis of single event effects at grazing angle [CMOS SRAMs]

Campbell, A.B., Musseau, O., Ferlet-Cavrois, V., Stapor, W.J., McDonald, P.T.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685247
Date:
June, 1998
File:
PDF, 883 KB
english, 1998
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