![](/img/cover-not-exists.png)
Multi-Zone Thermal Processing in Semiconductor Manufacturing: Bias Estimation
Han Yan,, Weng Khuen Ho,, Keck Voon Ling,, Khiang Wee Lim,Volume:
6
Language:
english
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/tii.2010.2040285
Date:
May, 2010
File:
PDF, 1.17 MB
english, 2010