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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Delay Fault Testability on Two-Rail Logic Circuits
Namba, Kazuteru, Ito, HideoYear:
2008
Language:
english
DOI:
10.1109/dft.2008.19
File:
PDF, 341 KB
english, 2008