[IEEE 13th IEEE International Conference on Electronics,...

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[IEEE 13th IEEE International Conference on Electronics, Circuits and Systems - Nice (2006.12.10-2006.12.13)] 2006 13th IEEE International Conference on Electronics, Circuits and Systems - Nyquist-criterion based design of a CT ΣΔ-ADC with a reduced number of comparators

De Maeyer, J., Rombouts, P., Weyten, L.
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Year:
2006
Language:
english
DOI:
10.1109/icecs.2006.379812
File:
PDF, 393 KB
english, 2006
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