Statistical investigation of dielectric breakdown of...

Integrated Ferroelectrics 1997 / 02 Vol. 15; Iss. 1-4

Statistical investigation of dielectric breakdown of strontium bismuth tantalate thin film capacitors

Finder, J., Melnick, B. M., Abrokwah, J., Ooms, B.
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Volume:
15
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708015705
Date:
February, 1997
File:
PDF, 722 KB
english, 1997
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