[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Rigorous extraction of process variations for 65nm CMOS design
Wei Zhao,, Yu Cao,, Liu, Frank, Agarwal, Kanak, Dhruva Acharyya,, Nassif, Sani, Nowka, KevinYear:
2007
Language:
english
DOI:
10.1109/essderc.2007.4430886
File:
PDF, 361 KB
english, 2007