[IEEE 2012 IEEE 23rd International Symposium on Software...

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[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - On the Use of Boundary Scan for Code Coverage of Critical Embedded Software

Cunha, Joao Carlos, Barbosa, Ricardo, Rodrigues, Gilberto
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Year:
2012
Language:
english
DOI:
10.1109/issre.2012.29
File:
PDF, 518 KB
english, 2012
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