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[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - A SOM approach to the failure physics of optoelectronic devices
Montangero, P., Azzini, G.A., Liberatore, M., Mancini, M., Pederzini, E., Serra, L.Year:
1993
Language:
english
DOI:
10.1109/relphy.1993.283271
File:
PDF, 470 KB
english, 1993