[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - Analysis of intra-level isolation test structure data by multiple regression facilitate rule identification for diagnostic expert systems
Freidhoff, C.B., Cresswell, M.W., Lowry, L.R., Irani, K.B.Year:
1989
Language:
english
DOI:
10.1109/icmts.1989.39312
File:
PDF, 521 KB
english, 1989