[IEEE 2007 2nd International Design and Test Workshop -...

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[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - A Novel Method of Test Generation for Asynchronous Circuits

Vasudevan, Dilip P.
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Year:
2007
Language:
english
DOI:
10.1109/idt.2007.4437420
File:
PDF, 2.47 MB
english, 2007
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