[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - A Novel Method of Test Generation for Asynchronous Circuits
Vasudevan, Dilip P.Year:
2007
Language:
english
DOI:
10.1109/idt.2007.4437420
File:
PDF, 2.47 MB
english, 2007