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[IEEE Days on Diffraction 2012 (DD) - St.Petersburg, Russia (2012.05.28-2012.06.1)] 2012 Proceedings of the International Conference Days on Diffraction - Integrated nonparametric estimations of probability density of stochastic processes by atomic functions

Kravchenko, Victor F., Churikov, Dmitry V.
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Year:
2012
Language:
english
DOI:
10.1109/dd.2012.6402769
File:
PDF, 3.08 MB
english, 2012
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