[IEEE International Electron Devices Meeting. Technical...

  • Main
  • [IEEE International Electron Devices...

[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Search for the optimal channel architecture for 0.18/0.12 μm bulk CMOS experimental study

Bouillon, P., Skotnicki, T., Kelaidis, C., Gwoziecki, R., Dollfus, P., Regolini, J.-L., Sagnes, I., Bodnar, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1996
Language:
english
DOI:
10.1109/iedm.1996.554045
File:
PDF, 424 KB
english, 1996
Conversion to is in progress
Conversion to is failed