[IEEE 2009 IEEE International Conference on Multimedia and Expo (ICME) - New York, NY, USA (2009.06.28-2009.07.3)] 2009 IEEE International Conference on Multimedia and Expo - Wrinkle feature-based skin age estimation scheme
Kim, Kyungrok, Choi, Young-Hwan, Hwang, EenjunYear:
2009
Language:
english
DOI:
10.1109/ICME.2009.5202721
File:
PDF, 380 KB
english, 2009