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Stark effect on confined impurities in semiconductor multi-quantum-well structures
B.S. Yoo, L. He, B.D. McCombe, W. SchaffVolume:
8
Year:
1990
Language:
english
Pages:
4
DOI:
10.1016/0749-6036(90)90251-2
File:
PDF, 381 KB
english, 1990