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[IEEE 2013 Joint Conference of the 23nd International Workshop on Software Measurement and the 8th International Conference on Software Process and Product Measurement (IWSM-MENSURA) - Ankara, Turkey (2013.10.23-2013.10.26)] 2013 Joint Conference of the 23rd International Workshop on Software Measurement and the 8th International Conference on Software Process and Product Measurement - A Comparison of Different Defect Measures to Identify Defect-Prone Components
Oyetoyan, Tosin Daniel, Conradi, Reidar, Cruzes, Daniela SoaresYear:
2013
Language:
english
DOI:
10.1109/iwsm-mensura.2013.34
File:
PDF, 1.21 MB
english, 2013