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[IEEE 29th Annual Reliability Physics 1991 - Las Vegas, NV, USA (9-11 April 1991)] 29th Annual Proceedings Reliability Physics 1991 - A comparison of inverter-type circuit lifetime and quasi-static analysis of NMOSFET lifetime
Rakkhit, R., Yue, J.T.Year:
1991
DOI:
10.1109/relphy.1991.145996
File:
PDF, 375 KB
1991