Long term instabilities in the defect assembly in...

IEEE Transactions on Nuclear Science 1997 / 6 Vol. 44; Iss. 3

Long term instabilities in the defect assembly in irradiated high resistivity silicon detectors

Eremin, V., Ivanov, A., Verbitskaya, E., Li, Z., Schmidt, B.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603759
Date:
June, 1997
File:
PDF, 616 KB
english, 1997
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