![](/img/cover-not-exists.png)
[IEEE 2011 8th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON 2011) - Khon Kaen, Thailand (2011.05.17-2011.05.19)] The 8th Electrical Engineering/ Electronics, Computer, Telecommunications and Information Technology (ECTI) Association of Thailand - Conference 2011 - Extraction of mobility degradation, effective channel length and total series resistance of NMOS at elevated temperature
Kiddee, Kunagone, Ruangphanit, Anucha, Niemcharoen, Surasak, Atiwongsangthong, Narin, Muanghlua, RangsonYear:
2011
Language:
english
DOI:
10.1109/ecticon.2011.5947755
File:
PDF, 1.36 MB
english, 2011