On approaches to the built-in electric-field calculations...

On approaches to the built-in electric-field calculations in shallow silicon n+-p junctions

Silard, A.P.
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Volume:
6
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/edl.1985.26063
Date:
March, 1985
File:
PDF, 321 KB
english, 1985
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