[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Stress analysis on centric through hole PCB
Sauli, Z., Retnasamy, V., Rahman, N. A. Z., Man, B., Nadzri, N. S., Vairavan, R.Year:
2012
Language:
english
DOI:
10.1109/smelec.2012.6417226
File:
PDF, 466 KB
english, 2012