![](/img/cover-not-exists.png)
[IEEE 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI - Canberra, ACT, Australia (3-7 July 2000)] 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI (Cat. No.00CH37046) - Application of charged insulator defects for the realisation of low-dimensional structures in silicon
Wu, J.E., Gauja, E., Vogl, B., Puzzer, T., Lumpkin, N.E., Dzurak, A.S., Ckark, R.G., Aberle, A.G.Year:
2000
Language:
english
DOI:
10.1109/sim.2000.939229
File:
PDF, 269 KB
english, 2000