[IEEE 2007 2nd IEEE Conference on Industrial Electronics and Applications - Harbin, China (2007.05.23-2007.05.25)] 2007 2nd IEEE Conference on Industrial Electronics and Applications - A New Faulted Line Identification Method Based on Incremental Impedances
Zhu, Ke, Wang, Wencong, Xu, WilsunYear:
2007
DOI:
10.1109/iciea.2007.4318402
File:
PDF, 245 KB
2007