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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines
Takahashi, Hiroshi, Higami, Yoshinobu, Kadoyama, Shuhei, Aikyo, Takashi, Takamatsu, YuzoYear:
2007
Language:
english
DOI:
10.1109/ats.2007.34
File:
PDF, 327 KB
english, 2007